三维成像技术

使用普通光学显微镜所看到的图像只是真实三维物体的二维表征。

CSM提供给您真正的三维成像工具：微米尺度的共焦显微镜(Conscan)以及纳米尺度的原子力显微镜。它们都可以整合到CSM产品的测量平台上。

 

csm title Related documents
Application Bulletin n°38

Physical characterization of coated surfaces - Part II : Scratch Test
Application Bulletin n°10

- New LOC module for the SFM provides high resolution frictional contrast
- Characterization of Tribological transfer films using combined NHT/SFM
Application Bulletin n°09

- MST Swinging Module for variable frequency scratch testing
- Combined NHT/SFM for investigation the mechanical properties of Cr2O3 thin films
- New Industrial Calotest allows greater fl exibility for measuring over/undersized samples
Application Bulletin n°07

- Forthcoming Nano Scratch Tester (NST) for characterization of ultra-thin films
- Micro structured silicon wafers compared with the CSM Tribometer
- Combined NHT/SFM for investigating the tip defect of common indenters
Application Bulletin n°06

- Micro Scratch Tester (MST) for assessing the scratch resistance of SiO2 passivation layers
- High-Vacuum Tribometer for MoS2 alloy characterization
- Combined NHT/SFM for characterization of Silicon materials
Application Bulletin n°05

- Finer particle size allows better coating characterization with the Calotest
- Combined NHT/SFM for characterization of coated systems
Application Bulletin n°04

- Modified Pin-on-Disc Tribometer for controlled lubricant studies
- Diamond knife for MST characterization of coated optical fibers
- Controlling magnetic hard disk adhesion to ceramic substrates with the MST
- Scanning force microscopy of low load indentations into aluminum thin films