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Immagini 3D

Imagerie 3DImagerie 3D Molto spesso i microscopisti acquisiscono un'immagine che è una rappresentazione bidimensionale di un oggetto che in realtà è tridimensionale.
La visualizzazione tridimensionale sui nostri strumenti è ottenuta, per la scala micrometrica, con il profilometro Conscan, e per le immagini a scala nanometrica con il microscopio a forza atomica.

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Application Bulletin n°10

- New LOC module for the SFM provides high resolution frictional contrast
- Characterization of Tribological transfer films using combined NHT/SFM
Application Bulletin n°09

- MST Swinging Module for variable frequency scratch testing
- Combined NHT/SFM for investigation the mechanical properties of Cr2O3 thin films
- New Industrial Calotest allows greater fl exibility for measuring over/undersized samples
Application Bulletin n°07

- Forthcoming Nano Scratch Tester (NST) for characterization of ultra-thin films
- Micro structured silicon wafers compared with the CSM Tribometer
- Combined NHT/SFM for investigating the tip defect of common indenters
Application Bulletin n°06

- Micro Scratch Tester (MST) for assessing the scratch resistance of SiO2 passivation layers
- High-Vacuum Tribometer for MoS2 alloy characterization
- Combined NHT/SFM for characterization of Silicon materials
Application Bulletin n°05

- Finer particle size allows better coating characterization with the Calotest
- Combined NHT/SFM for characterization of coated systems
Application Bulletin n°04

- Modified Pin-on-Disc Tribometer for controlled lubricant studies
- Diamond knife for MST characterization of coated optical fibers
- Controlling magnetic hard disk adhesion to ceramic substrates with the MST
- Scanning force microscopy of low load indentations into aluminum thin films
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