Atomic Force Microscope (AFM)

Atomic Force Microscope, or Scanning Probe Microscopy (AFM, SPM), is an extremely accurate and versatile technique for measuring surface topography at the nanoscale. A very fine sensor tip mounted to the end of a small deflecting cantilever is brought into contact with the sample surface to be investigated. The sensor tip is moved across the surface in numerous line scans, which produces a three-dimensional image of the surface with ultra high resolution. This technique is especially useful for imaging residual scratches, indentations or other nanoscale surface features as well as accurately measuring their dimensions.

Features

• The combination of optical and Scanning Probe Microscopy (SPM) opens up new possibilities in quantitative visual surface characterization:
• Optical inspection of large sample areas with the ability to zoom in on interesting structures with sub-nanometer resolution
• Analysis of micro or nanostructures
• Critical Dimension (CD) measurements
• Investigation of etched structures and roughness
• Profile analysis of coatings and thin films
• Measurements of surfaces with low optical contrast
• Characterization of fragile biological tissue as well as many other applications in materials and surface research

Options

• Non-contact Mode
• Lateral Force Microscopy
• Magnetic Force Microscopy
• Pulsed Force Mode
• Electrostatic Force Microscopy
• Scanning Thermal Microscopy
• Conductive Force Microscopy
• Liquid cell