3D Imaging

Very often the measurement system user captures an image that is a two dimensional representation of what is really a three dimensional object.

Micro-scale optical profilometry (Conscan) and Nano-scale imaging (Atomic Force Microscope) are available options with our instruments to provide the necessary third dimension of the image.

csm title Related documents
Application Bulletin n°38

Physical characterization of coated surfaces - Part II : Scratch Test
Application Bulletin n°10

- New LOC module for the SFM provides high resolution frictional contrast
- Characterization of Tribological transfer films using combined NHT/SFM
Application Bulletin n°09

- MST Swinging Module for variable frequency scratch testing
- Combined NHT/SFM for investigation the mechanical properties of Cr2O3 thin films
- New Industrial Calotest allows greater fl exibility for measuring over/undersized samples
Application Bulletin n°07

- Forthcoming Nano Scratch Tester (NST) for characterization of ultra-thin films
- Micro structured silicon wafers compared with the CSM Tribometer
- Combined NHT/SFM for investigating the tip defect of common indenters
Application Bulletin n°06

- Micro Scratch Tester (MST) for assessing the scratch resistance of SiO2 passivation layers
- High-Vacuum Tribometer for MoS2 alloy characterization
- Combined NHT/SFM for characterization of Silicon materials
Application Bulletin n°05

- Finer particle size allows better coating characterization with the Calotest
- Combined NHT/SFM for characterization of coated systems
Application Bulletin n°04

- Modified Pin-on-Disc Tribometer for controlled lubricant studies
- Diamond knife for MST characterization of coated optical fibers
- Controlling magnetic hard disk adhesion to ceramic substrates with the MST
- Scanning force microscopy of low load indentations into aluminum thin films