Imagerie 3D

Imagerie 3DImagerie 3D Dans la majorité des cas, l'utilisateur de microscope dispose d'une représentation en 2 dimensions d'un objet à 3 dimensions. Afin de pallier cet inconvénient, la profilométrie confocale ainsi que la microscopie à force atomique sont disponibles sur nos instruments.

csm title Related documents
Application Bulletin n°10

- New LOC module for the SFM provides high resolution frictional contrast
- Characterization of Tribological transfer films using combined NHT/SFM
Application Bulletin n°09

- MST Swinging Module for variable frequency scratch testing
- Combined NHT/SFM for investigation the mechanical properties of Cr2O3 thin films
- New Industrial Calotest allows greater fl exibility for measuring over/undersized samples
Application Bulletin n°07

- Forthcoming Nano Scratch Tester (NST) for characterization of ultra-thin films
- Micro structured silicon wafers compared with the CSM Tribometer
- Combined NHT/SFM for investigating the tip defect of common indenters
Application Bulletin n°06

- Micro Scratch Tester (MST) for assessing the scratch resistance of SiO2 passivation layers
- High-Vacuum Tribometer for MoS2 alloy characterization
- Combined NHT/SFM for characterization of Silicon materials
Application Bulletin n°05

- Finer particle size allows better coating characterization with the Calotest
- Combined NHT/SFM for characterization of coated systems
Application Bulletin n°04

- Modified Pin-on-Disc Tribometer for controlled lubricant studies
- Diamond knife for MST characterization of coated optical fibers
- Controlling magnetic hard disk adhesion to ceramic substrates with the MST
- Scanning force microscopy of low load indentations into aluminum thin films