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Ultra Nanoindentation Tester (UNHT)
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THE NEW GENERATION OF NANOINDENTERCSM Instruments has introduced a new nano range high resolution nanoindenter with ultra low thermal drift. When used per ISO 14577 test methods the Ultra Nano Hardness Tester will provide the most accurate data of any instruments on the market. This new nanoindentation instrument, is based on the principle of using an axis of measurement and an axis of reference, each one having its own actuator and its own sensors of depth and force. It is therefore possible to carry out active referencing of the surface of the sample. |
The nano indentation technique is known as Depth-Sensing Indentation (DSI), as the penetration depth is continuously monitored as a function of load during the instrumented indentation test. This technique has been largely used to evaluate mechanical properties of materials at the nanoscale level, especially hardness and elastic modulus. Given the range of depths (nm) and forces (µN) involved, the highest accuracy of the measured penetration depth and applied force over time is therefore essential for this method. Accuracy and precision of the data are assured by having the lowest thermal drift currently available of any instrumented nanoindenter.
CSM Ultra Nanoindenter technical poster to download
Features
- Active top referencing (Patented Design)
The reference is removable and can be of different shapes (ball, pin, etc). The reference has its own piezo actuator and load sensor and applies a very small controlled (servo loop) load on the sample. - Thermal drift free
The head is constructed out of ZeroDur® glass and the electronics system has a drift rate of ≈ 1ppm/°C. - Highest load frame stiffness
Thanks to the marble base platform, the choice of materials (ZeroDur) and the patented active top referencing. - Two independent depth and load sensors
Ultra high resolution capacitive sensors for True Depth and Load Control modes. - Ultra high resolution and very low noise floor
Depth resolution: 0.001 nm, noise floor ≈ 0.1nm
Force resolution: 0.01 μN, noise floor ≈ 0.5µN - Perfect positional synchronization
The Ultra Nanoindentation Tester is perfectly “positionally synchronized” with a high quality optical video microscope and/or an optional Atomic Force Microscope (AFM). The combination of the Ultra Nanoindentation Tester head, the optical microscope and the AFM objective provides great flexibility and ease-of-use, as well as accurate three-dimensional imaging at the nanometer scale. - Compliant to ISO 14577 and ASTM E2546
CSM Instruments produces instruments and measurements that conform perfectly to ISO and ASTM standards
Options
- Vacuum or environmental control enclosure
- Acoustic damping enclosure
- Atomic Force Microscope
- High resolution sample stage (0.25um accuracy)
- High resolution camera
CSM Ultra Nanoindentation Tester technical poster to download
Related links
Related documents
| Products catalogs | |
| Indentation Catalog | |
| Application Bulletin n°37 |
Physical characterization of coated surfaces - Part I : Instrumented Indentation |
| Application Bulletin n°36 |
On the use of nanoindentation for the determination of visco-elastic properties of polymers |
| Application Bulletin n°35 |
Nanoindentation approach to mechanical testing of extremely soft materials |
| Application Bulletin n°31 |
This paper will explain with different applications the advantages of the new generation of CSM Nanoindenter called Ultra Nanoindentation Tester |
| Application Bulletin n°29 |
Mechanical Properties of Cementitious Materials |
