Home » Products » Scratch » Nano Scratch Tester (NST)

Nano Scratch Tester (NST)

Nano ScratchNano Scratch

The Nano-Scratch Tester is specially suited to characterize practical adhesion failure of thin films and coatings, with a typical thickness below 800 nm. The Nano Scratch Tester can be used in the analysis of organic and inorganic; soft and hard coatings. Examples are thin and multilayer PVD, CVD, PECVD, photoresist, paints lacquers, and many other types of films, covering optical, micro-electronic, protective, decorative and other applications. Substrates can be hard or soft, including metal alloys, semiconductors, glass, refractive and organic materials.

Features

  • Diamond stylus scratch method
  • Automated optical microscopic inspection
  • Feedback controlled force actuator
  • Scratch depth measurement
  • Compatible to ASTM D7187

Options

  • Wide range of indenter scratching stylus.
  • Nano/Micro Hardness measurement modules
  • Vacuum, humidity and temperature controlled
  • AFM and Conscan 3D imaging

csm title Related links

csm title Related documents
Scratch Catalog
Products catalogs
Application Bulletin n°30

Nanoindentation and Nanoscratch of Oxide Coatings on Thin Film Polymer Substrates

Measurement of Acoustic Emission during Microindentation
Application Bulletin n°28

Characterization of thermal spray coatings by instrumented indentation and scratch testing: Part l
Application Bulletin n°27

Mechanical properties of ultrananocrystalline diamond (UNCD) films with an influence of the nucleation density on the structure
Application Bulletin n°15

- Characterization of Polymers
- Quality Control of Minidisk polymer topcoat with Nano Scratch Tester and Tribometer
- Nano Scratch method developed as reference test for polymeric automobile topcoats
- Failure properties of nail varnish investigated with the Micro Scratch Teste

Application Bulletin n°13

- Influence of tip size on the critical load during scratch testing with the Micro Scratch Tester
- Failure of TiN-coated polymer measured with the Pin-on-Disk Tribometer
- Nano-Scratch Tester (NST) for measurement of dielectric thin films

Application Bulletin n°12

- Micro-Electronic Applications
- Nano-Scratch Tester (NST) for characterizing anti-stiction coatings for Microsystems
- In-situ Integrated Circuit (IC) characterization with the Nano Hardness Tester (NHT)
- Quality control of Micro-Slit reflective coating with the Nano-Scratch Tester (NST)
Application Bulletin n°11

- Nanoindentation with spherical indenters for characterization of stress-strain properties
- Characterization of IC bonded gold wires with the Nano Hardness Tester (NHT)
- New Nano-Scratch Tester (NST) allows better magnetic hard disk characterization
Application Bulletin n°07

- Forthcoming Nano Scratch Tester (NST) for characterization of ultra-thin films
- Micro structured silicon wafers compared with the CSM Tribometer
- Combined NHT/SFM for investigating the tip defect of common indenters
Application Bulletin n°04

- Modified Pin-on-Disc Tribometer for controlled lubricant studies
- Diamond knife for MST characterization of coated optical fibers
- Controlling magnetic hard disk adhesion to ceramic substrates with the MST
- Scanning force microscopy of low load indentations into aluminum thin films
»
Home