Instrumented Indentation Testers (IIT)

//// Introduction of CSM Indentation Testers

CSM Instruments Indentation Testers are high precision instruments used for the determination of mechanical properties of thin films, coatings and substrates. Properties such as hardness and elastic modulus can be determined on almost any type of material: soft, hard, brittle or ductile.
The operating principles of the instrument are as follows: an indenter tip, normal to the sample surface, is driven into the sample by applying an increasing load up to a preset value. The load is then gradually decreased until partial or complete relaxation of the material occurs.

//// Features of the Indentation Testers

> Unique top surface referencing technique

CSM Instruments Indentation Testers are the only commercially available instruments which use the top surface referencing technique.
By performing a differential measurement between the sample surface and the indentation depth, the following unique advantages are obtained:

- High accuracy of depth measurement       
- Rapid measurement cycle time       
- Negligible thermal drift

The surface referencing design also eliminates common sources of measurement errors in order to provide:

- Negligible system frame compliance
- High sample mounting stability

> Hardness & Elastic modulus determination down to a few nm

> Automated multi-sample handling

> Berkovich, Vickers, Spherical, Cube corner, Knoop, more on request

> Sinus Mode Analysis (DMA) for viscoelastic properties

The Dynamic Mechanical Analysis (DMA) uses sine wave loading curves to obtain a complete analysis of the mechanical properties of viscoelastic materials. The method allows for a continuous acquisition of hardness, elastic modulus, storage and loss modulus data as a function of indentation depth.
The sinus mode is available on our Nanoindentation and Ultra Nanoindentation Testers only.

> Creep, fatigue and fracture toughness test

> Flexibility and upgradability

> Very high throughput and reproducibility

> Video microscope with multifocus

> Optional AFM or ConScan objective

Since the Video Microscope, Indenter tip and AFM are positionally calibrated to each other, the location of the indenter imprint under either the video microscope or the AFM is automated and virtually instantaneous.

> Complies with ISO 14577 and ASTM E2546

> Handling system for large samples (up to 300 mm)

> Ease-of-Use software