CONSCAN objective (CON)

The Conscan Objective provides the perfect combination of high resolution 3D chromatic confocal technology with the advantages of traditional microscopy. It opens up new possibilities in quantitative surface characterization in the micron - millimeter scale.

Features

• Ideal addition to CSM Instruments micro-range products for analyzing the 3D topography of micro-scratches and micro-indentations.
• Non-contact measurement
• Large XY scanning range (using instrument's XY tables)
• High Z-axis dynamic range (up to 400 microns)
• Accurate measurement of 2D profiles, 3D topography and surface roughness
• Ability to perform measurements on transparent surfaces
• Measurements rough or polished surfaces
• Wide range of objectives for different height ranges