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Nano Indentation Tester

Applications

The Nano-Indentation Tester is specially suited to load and penetrate with depth measurements at the nanometer scale. The Nano-Indentation Tester can be used in the analysis of organic and inorganic soft and hard coatings. Examples are thin and multilayer PVD, CVD, PECVD, photoresist, paints lacquers, and many other types of films, covering optical, micro- electronic, protective, decorative and other applications. Substrates can be hard or soft, including metal alloys, semiconductors, glass, refractive and organic materials.

Features

  • Unique top-referencing method
  • Automated optical microscopic inspection before and after testing
  • Feedback-controlled force actuator
  • Differential capacitive measurements of indentation depths
  • PC software package for automated data acquisition, storage and evaluation

Options

  • Vacuum or climatic control
  • Atomic Force Microscope
  • High resolution camera
  • Environmental Enclosure
  • X & Y High resolution table (accuracy of 0.25um)

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Products catalogs
Indentation Catalog
Application Bulletin n°27

Mechanical properties of ultrananocrystalline diamond (UNCD) films with an influence of the nucleation density on the structure
Application Bulletin n°24

Intrinsic bone tissue quality is altered in osteoporosis and selectively influenced by its treatments (NHT)
Application Bulletin n°23

The Influence of Surface Roughness on Instrumented Indentation Testing (IIT) (NHT/MHT)
Application Bulletin n°22

Investigation of creep behaviour using Micro or Nano Indentation Tester (MHT/NHT)

Application Bulletin n°21

Investigation of the surface fracture resistance of a SiN coating by Impact testing (NTR)
Application Bulletin n°12

- Micro-Electronic Applications
- Nano-Scratch Tester (NST) for characterizing anti-stiction coatings for Microsystems
- In-situ Integrated Circuit (IC) characterization with the Nano Hardness Tester (NHT)
- Quality control of Micro-Slit reflective coating with the Nano-Scratch Tester (NST)
Application Bulletin n°11

- Nanoindentation with spherical indenters for characterization of stress-strain properties
- Characterization of IC bonded gold wires with the Nano Hardness Tester (NHT)
- New Nano-Scratch Tester (NST) allows better magnetic hard disk characterization
Application Bulletin n°10

- New LOC module for the SFM provides high resolution frictional contrast
- Characterization of Tribological transfer films using combined NHT/SFM
Application Bulletin n°09

- MST Swinging Module for variable frequency scratch testing
- Combined NHT/SFM for investigation the mechanical properties of Cr2O3 thin films
- New Industrial Calotest allows greater fl exibility for measuring over/undersized samples
Application Bulletin n°07

- Forthcoming Nano Scratch Tester (NST) for characterization of ultra-thin films
- Micro structured silicon wafers compared with the CSM Tribometer
- Combined NHT/SFM for investigating the tip defect of common indenters
Application Bulletin n°06

- Micro Scratch Tester (MST) for assessing the scratch resistance of SiO2 passivation layers
- High-Vacuum Tribometer for MoS2 alloy characterization
- Combined NHT/SFM for characterization of Silicon materials
Application Bulletin n°05

- Finer particle size allows better coating characterization with the Calotest
- Combined NHT/SFM for characterization of coated systems
Application Bulletin n°03

- New integrated SFM objective for better characterization of NHT indentations
- Modified Micro Scratch Tester (MST) for im­proved force resolution at low loads
- Hard coating characterisation with the CSM Tribometer
Application Bulletin n°01

- New Nano-Hardness Tester (NHT) for characterization of MoS2 thin films
- Automobile bumper paint adhesion analyzed using Micro Scratch Tester (MST)
- Using CSM's Revetest (RVT) scratch-tester for Rockwell indentation
- Hard coating characterization with the Revetest (RVT) scratch tester
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