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3D Imaging

Very often the microscope user is capturing an image that is a two dimensional representation of what is really a three dimensional object.

Micro-scale profilometry (Conscan objective) and Nano-scale imaging (Atomic Force Microscope) are available with our instruments as well.

Related documents


Application Bulletin n°10	- New LOC module for the SFM provides high resolution frictional contrast - Characterization of Tribological transfer films using combined NHT/SFM
Application Bulletin n°09	- MST Swinging Module for variable frequency scratch testing - Combined NHT/SFM for investigation the mechanical properties of Cr2O3 thin films - New Industrial Calotest allows greater fl exibility for measuring over/undersized samples
Application Bulletin n°07	- Forthcoming Nano Scratch Tester (NST) for characterization of ultra-thin films - Micro structured silicon wafers compared with the CSM Tribometer - Combined NHT/SFM for investigating the tip defect of common indenters
Application Bulletin n°06	- Micro Scratch Tester (MST) for assessing the scratch resistance of SiO2 passivation layers - High-Vacuum Tribometer for MoS2 alloy characterization - Combined NHT/SFM for characterization of Silicon materials
Application Bulletin n°05	- Finer particle size allows better coating characterization with the Calotest - Combined NHT/SFM for characterization of coated systems
Application Bulletin n°04	- Modified Pin-on-Disc Tribometer for controlled lubricant studies - Diamond knife for MST characterization of coated optical fibers - Controlling magnetic hard disk adhesion to ceramic substrates with the MST - Scanning force microscopy of low load indentations into aluminum thin films